Epitaxial SrBi2Nb2O9 films were grown by laser ablation on (001)YBa2Cu
3O7-delta/(100)SrTiO3 and (001)NdGaO3, with c axis normal to the subst
rate plane. The SrBi2Nb2O9 films were grown in a layer-by-layer regime
on NdGaO3 substrates in 25-Angstrom steps at a condensation temperatu
re of 700 degrees C, Microinclusions of secondary phases and a-oriente
d grains were observed to exist on the surface of (001)SrBi2Nb2O9 film
s grown on (001)YBa2Cu3O7-delta/(100)SrTiO3. The dielectric permittivi
ty of the SrBi2Nb2O9 films measured along the c axis is 123 (T = 300 K
, f = 100 kHz), and tan delta approximate to 0.04. (C) 1997 American I
nstitute of Physics.