Epitaxial LaNiO3(LNO) thin films were deposited on Si(100) substrates by pu
lsed laser deposition. (100)-oriented films, without any other orientations
, were obtained by using an intermediate double layer of CeO2/YSZ. We studi
ed the influence of substrate temperature and oxygen pressure on the crysta
l structure and room temperature electrical resistivity of LNO films. Optim
al processing conditions allow the growth of LNO films with surface morphol
ogy, crystal structure and electrical properties suitable for the use of th
e conductive layer as an electrode in ferroelectric capacitors. (C) 2001 El
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