Influence of the post-treatment on the properties of ZnO thin films

Citation
P. Nunes et al., Influence of the post-treatment on the properties of ZnO thin films, THIN SOL FI, 383(1-2), 2001, pp. 277-280
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
383
Issue
1-2
Year of publication
2001
Pages
277 - 280
Database
ISI
SICI code
0040-6090(20010215)383:1-2<277:IOTPOT>2.0.ZU;2-S
Abstract
In this work a study of the influence of the annealing treatment (atmospher e and temperature) on the properties of zinc oxide thin films (intrinsic an d doped with indium and aluminum) prepared by spray pyrolysis is presented. The result shows that the type of atmosphere (reduction or oxidant) has an important role in the changes observed in the structural, electrical and o ptical properties of the ZnO thin films. The ZnO thin film doped with indiu m, presents the lowest resistivity (rho = 5.8 x 10(-3) Omega cm) associated to a high transmittance (T = 86%), characteristics required for applicatio n on optoelectronic devices. (C) 2001 Elsevier Science B.V. All rights rese rved.