Determination of phosphorus in raw materials for ceramics: comparison between X-ray fluorescence spectrometry and inductively coupled plasma-atomic emission spectrometry
Ma. Marina et Mcb. Lopez, Determination of phosphorus in raw materials for ceramics: comparison between X-ray fluorescence spectrometry and inductively coupled plasma-atomic emission spectrometry, ANALYT CHIM, 432(1), 2001, pp. 157-163
This paper compares methods for phosphorus determination in refractory sili
coaluminous materials based on inductively coupled plasma-atomic emission s
pectrometry (ICP-AES) and X-ray fluorescence (XRF) spectrometry. Chemical i
nterferences were studied by using several calibration standards and standa
rd additions. The Limits of detection obtained by XRF spectrometry (0.03 an
d 0.06 mg P2O5 per gram of sample) are clearly advantageous as compared wit
h those obtained by ICP-AES (0.2 mg g(-1)). Phosphorus can successfully be
determined by XRF spectrometry with either pressed sample pellets or dilute
d sample beads. Matrix effects were minimised by using a certified bauxite
as a standard, but several less-similar materials could be used, such as si
derurgic slag, chamotte and even dolomite for low P2O5 content samples. The
linear calibration range is larger (up to 100 mg g(-1)) when analysis is c
arried out by ICP-AES, using the 213.628 nm line. Repeatability is similar
with both methods, but XRF spectrometry is preferred on the grounds of the
better sensitivity achieved, and the simpler sample preparation requirement
s. (C) 2001 Elsevier Science B.V. All rights reserved.