Concentration profile calculation for buried ion-exchanged channel waveguides in glass using explicit space-charge analysis

Citation
J. Hazart et V. Minier, Concentration profile calculation for buried ion-exchanged channel waveguides in glass using explicit space-charge analysis, IEEE J Q EL, 37(4), 2001, pp. 606-612
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF QUANTUM ELECTRONICS
ISSN journal
00189197 → ACNP
Volume
37
Issue
4
Year of publication
2001
Pages
606 - 612
Database
ISI
SICI code
0018-9197(200104)37:4<606:CPCFBI>2.0.ZU;2-G
Abstract
Ionic conductivity inhomogeneity and its relation to space charge is analyz ed in the case of a two-ion exchange for channel waveguide fabrication in o ptical glass, The space-charge evolution equation is derived and discussed in a general binary ion exchange context, This leads to an efficient algori thm which computes current-density nonuniformity in the field-assisted bury ing of ion-exchanged waveguides, The algorithm exhibits excellent agreement with the classic potential equation perturbed by nonhomogeneous ionic cond uctivity, and is appreciably faster, We show that the homogeneous current-d ensity assumption is inaccurate for the calculation of the burying depth an d waveguide size in the case of a realistic glass with nonlinear ionic diff usivity.