A. Chandra et K. Chakrabarty, System-on-a-chip test-data compression and decompression architectures based on Golomb codes, IEEE COMP A, 20(3), 2001, pp. 355-368
Citations number
25
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
We present a new test-data compression method and decompression architectur
e based on variable-to-variable-length Golomb codes, The proposed method is
especially suitable for encoding precomputed test sets for embedded cores
in a system-on-a-chip (SoC), The major advantages of Golomb coding of test
data include very high compression, analytically predictable compression re
sults, and a low-cost and scalable on-chip decoder, In addition, the novel
interleaving decompression architecture allows multiple cores in an SoC to
be tested concurrently using a single automatic test equipment input-output
channel. We demonstrate the effectiveness of the proposed approach by appl
ying it to the Internaional Symposium on Circuits and Systems' benchmark ci
rcuits and to two industrial production circuits. We also use analytical an
d experimental means to highlight the superiority of Golomb codes over run-
length codes.