A simple continuum model for boron clustering based on atomistic calculations

Boron exhibits anomalous diffusion during the initial phases of ion implant annealing. Boron transient enhanced diffusion is characterized by enhanced tail diffusion coupled with an electrically inactive immobile peak. The im mobile peak is due to clustering of boron in the presence of excess interst itials which also enhance boron diffusion in the tail region. We present a simple model for the formation of immobile boron interstitial clusters and associated point defect interactions derived based on atomistic calculation s. (C) 2001 American Institute of Physics.