Analysis of interfacial thermal stresses in a trimaterial assembly

Authors
Citation
E. Suhir, Analysis of interfacial thermal stresses in a trimaterial assembly, J APPL PHYS, 89(7), 2001, pp. 3685-3694
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
7
Year of publication
2001
Pages
3685 - 3694
Database
ISI
SICI code
0021-8979(20010407)89:7<3685:AOITSI>2.0.ZU;2-7
Abstract
The interfacial stresses in, and the curvature of, an elongated trimaterial assembly, subjected to the change in temperature, are predicted based on a n approximate structural analysis (strength-of-materials) model. The obtain ed results can be helpful in stress-strain evaluations and physical design of trimaterial assemblies in microelectronic and photonic packaging. (C) 20 01 American Institute of Physics.