Z. Erdelyi et al., Determination of grain-boundary diffusion of Ag in nanocrystalline Cu by the Hwang-Balluffi method, J APPL PHYS, 89(7), 2001, pp. 3971-3975
From the Ag and Cu Auger signals measured on the surface of nanocrystalline
Cu/Ag thin bilayers, the temperature dependence of the parameter omega' fo
r Ag grain-boundary diffusion in Cu (omega (')=deltak(b)D(b)/delta (s)k(s),
where delta and delta (s) are the width of the grain boundary and the segr
egated layer and k(b) and k(s) are the grain-boundary and surface segregati
on factors, respectively) have been determined by the Hwang-Balluffi method
in the C-kinetics regime over the temperature range of 393-428 K. These va
lues have been compared with triple products, P=deltak(b)D(b), determined i
n the temperature range 584-804 K by Bernardini [Phil. Mag. A 73, 237 (1996
)] using radio tracer technique in the B-kinetics regime and the temperatur
e dependence of the surface segregation factor has been extracted. The surf
ace segregation energy (34 +/- 16 kJ/mol) agrees well with other data publi
shed in the literature. (C) 2001 American Institute of Physics.