Atomic layer epitaxy growth of ZnTe films is achieved using a novel isother
mal closed-space sublimation system with elemental sources. X-rays, electro
n diffraction and optical measurements indicated the epitaxial quality of t
he films and confirmed a self-regulated atomic layer epitaxy regime. As the
procedure is near equilibrium, the self-regulation mechanism is different
from that occurring in other techniques like molecular beam epitaxy. In the
present case, the difference in vapor pressures between the elemental sour
ce and the growing surface is the driving force for the growth; this differ
ence being zero once the surface is completely covered. (C) 2001 Elsevier S
cience B.V. All rights reserved.