Jl. Cao et al., An XPS study on the degradation of lead magnesium niobate-based relaxor ferroelectrics during nickel electroplating, J MAT CHEM, 11(4), 2001, pp. 1198-1200
Resistance degradation of Pb(Mg1/3Nb2/3)O-3-Pb(Zn1/3Nb2/3)O-3-PbTiO3 (PMZNT
) relaxor ferroelectrics during nickel electroplating was investigated by r
esistivity measurement and X-ray photoelectron spectroscopy (XPS) through t
he appearance of changes in Nb 3d and Pb 4f spectra. It was found that the
insulation resistance of the PMN-based ceramics decreased after electroplat
ing. The XPS analysis showed that the ceramic materials had been reduced by
hydrogen during electroplating and Nb4+ and metallic Pb were generated. As
a result, oxygen vacancies and free electrons were created and, therefore,
increased the conductivity of the ferroelectrics. It was also found that N
b5+ reduction was prior to Pb2+ reduction. On the basis of our experiments,
two conduction mechanisms involved in the hydrogen-induced resistance degr
adation were established.