Onion-skin method (OSM) analysis of DIII-D edge measurements

OSM analysis provides, in principle a method for establishing the 2-D edge 'fields' of n(e), T-e, T-i, etc., which is the prerequisite for analyzing t he physics processes occurring in the edge, including impurity behavior. In order to further test this method, an OSM analysis of an extensive edge da tabase for an L-mode DIII-D discharge has been carried out, the first part of which is reported here. Consistency of the OSM results with Langmuir pro be, D-alpha, and edge Thomson scattering measurements encourages further de velopment of the method. (C) 2001 Elsevier Science B.V. All rights reserved .