Thermal imidization of fluorinated poly(amic acid)s on Si(100) surfaces modified by plasma polymerization and deposition of glycidyl methacrylate

Citation
Y. Zhang et al., Thermal imidization of fluorinated poly(amic acid)s on Si(100) surfaces modified by plasma polymerization and deposition of glycidyl methacrylate, LANGMUIR, 17(7), 2001, pp. 2265-2274
Citations number
48
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
LANGMUIR
ISSN journal
07437463 → ACNP
Volume
17
Issue
7
Year of publication
2001
Pages
2265 - 2274
Database
ISI
SICI code
0743-7463(20010403)17:7<2265:TIOFPA>2.0.ZU;2-8
Abstract
Plasma polymerization of glycidyl methacrylate (GMA) on pristine and plasma -pretreated Si(100) surfaces was carried out. The epoxide functional groups of the plasma-polymerized GMA (pp-GMA) could be preserved, to a large exte nt, by controlling the glow discharge parameters. The pp-GMA. film was used as an adhesion promotion layer for the thermal imidization of fluorinated poly(amic acid) (FPAA) precursors on Si substrates. The fluorinated polyimi de (FPI)/pp-GMA-Si laminates so formed exhibited a 180 degrees -peel adhesi on strength as high as 10 N/cm. This value was much higher than the negligi ble adhesion strength for the FPI/Si laminates obtained from thermal imidiz ation of the FPAAs on either the pristine or the argon-plasma-treated Si su rfaces. The high adhesion strengths of the FPI/pp-GMA-Si laminates were att ributed to the synergistic effect of coupling the curing of the epoxide gro ups in the pp-GMA layer with the imidization process of the FPAAs and the f act. that the plasma-deposited GMA chains were covalently tethered on the S i(100) surface. Comparison of the adhesion strengths of the FPI/pp-GMA-Si l aminates to that. of the polyimide (Pl)pp-GMA-Si laminate, formed by therma l imidization of the poly(amic acid) precursor of poly(pyromellitic dianhyd ride-co-4,4 ' -oxydianiline) on pp-GMA-Si, suggests that the presence of fl uorine-containing groups, such as -CF3, in the PI chains has a negligible e ffect on the adhesion property of the FPIs on title Si(100) wafer surface m odified by the present interfacial molecular design and lamination techniqu e.