Local characterisation of large area multicrystalline solar cells by non-destructive mapping

The development of suitable semiconductor devices needs the use of non-dest ructive characterisation techniques with good spatial resolution. The aim o f this paper is to use light-beam-induced current (LBIC) mapping and infrar ed thermography (IRT) to control large area solar cells. Samples analysed i n this study are industrial 10cm x 10cm multicrystalline silicon solar. The LBIC experimental set-up works at 780 nm which is a well-suited wavelength for both as-grown and stressed silicon. A low laser diode power (0.15 mW) avoids any change in local transport properties; the spot diameter and the depth of field of the incident beam are 20 and 80 mum respectively. The inf rared camera is an Agema 880 SW with an InSb detector (working range: 3-5 m um) and a thermal resolution of about 0.1 K without signal treatment proces sing. Comparison between the two techniques is presented for analysis of lo cal shunts. (C) 2001 Elsevier Science Ltd. All rights reserved.