R. Chaoui et al., Development of an emitter for industrial silicon solar cells using the doped oxide solid source diffusion technique, RENEW ENERG, 23(3-4), 2001, pp. 417-428
The aim of this paper is to demonstrate for the first time the feasibility
of fabricating large-area screen-printed monocrystalline silicon solar cell
s using the Doped Oxide Solid Source (DOSS) diffusion technique. This proce
ss was applied to form the n(+)p emitter junction from highly doped sources
prepared in a POCl3 ambient. The diffusions were performed under a pure ni
trogen flow in the temperature range 900-1050 degreesC. In this investigati
on attention was devoted to the influence of the source doping level on the
fill factor. The solar cells were fabricated on industrial quality 4-inch
Cz wafers using a simple processing sequence incorporating screen-printed c
ontacts and a TiO2 antireflection coating deposited by spin-on. Fill factor
s as high as 79% were obtained. The potential benefit of retaining for pass
ivation purposes the thin residual oxide grown during phosphorus diffusion
was evaluated. These first experiments led to a cell efficiency close to 10
%. (C) 2001 Elsevier Science Ltd. All rights reserved.