Growth of in-plane textured LuNi2B2C thin films: correlation among structural, morphological and electrical properties

Citation
G. Grassano et al., Growth of in-plane textured LuNi2B2C thin films: correlation among structural, morphological and electrical properties, SUPERCOND S, 14(3), 2001, pp. 117-123
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SUPERCONDUCTOR SCIENCE & TECHNOLOGY
ISSN journal
09532048 → ACNP
Volume
14
Issue
3
Year of publication
2001
Pages
117 - 123
Database
ISI
SICI code
0953-2048(200103)14:3<117:GOITLT>2.0.ZU;2-W
Abstract
Thin films of the intermetallic superconducting compound LuNi2B2C have been prepared by pulsed laser ablation, and different deposition parameters (su bstrate temperature, target-substrate distance, laser beam energy density a nd thickness) have been the subject of extensive studies to optimize growth . The best samples show electrical properties similar to those of single cr ystals (T-c = 16.4 K, DeltaT(c) = 0.3 K, RRR = 13), are strongly c-axis-ori ented, and present a high density of in-plane-oriented surface structures. This in-plane texturing is found only in films some thousands of angstrom t hick, while if the thickness is reduced below 1000-1500 Angstrom, the sampl es are very flat, but there is no evidence of in-plane texturing.