A model for predicting deposition rates of plasma polymerized aniline films
in a pulsed inductively-coupled plasma reactor is presented. The model pro
poses a two-step deposition mechanism: dissociation of monomer by electron
collisions (fast) and subsequent (slow) diffusion of radicals toward the su
bstrate. A free radical mechanism is proposed and the dissociation rate con
stant is calculated based on the best available cross section information.
Results of the model are compared with axial and radial, polyaniline deposi
tion rate profiles measured in the reactor. Plasma parameters such as initi
al electron temperature, electron density and dissociation cross-section we
re varied in order to arrive at a good agreement between the model and meas
ured deposition rate data. The effect of these parameters on the model outp
ut is described. (C) 2001 Elsevier Science B.V. All rights reserved.