Thin polypyrrole films formed on mica and alumina with and without surfactant present: characterization by scanning probe and optical microscopy

Chemical deposition of electrically conducting polypyrrole (PPy) thin films on mica and alumina was carried out in aqueous solutions with and without surfactant. Examination of film morphology and thickness by atomic force mi croscopy (AFM) indicated a strong dependence of structure on the method of preparation. Films grown in the absence of surfactant were thicker than 150 nm with wrinkles present, indicating the overcoming of film-substrate adhe sion by internal film cohesion. Oxidative polymerization with surfactant al lowed reproducible synthesis of very thin films (50 nm thickness) with impr oved adhesion and suppressed formation of wrinkles. Experimental results ar e discussed within the context of a Stranski-Krastanov model of film growth . Film thickness and surface fractal dimensions were derived from AFM. Frac tal analysis of Pq films on alumina helped discern their presence on the mi croscopically rough substrate and quantitatively expressed the changes in s ample color by surface roughness. (C) 2001 Published by Elsevier Science B. V. All rights reserved.