Solution processed CdS thin film transistors

Citation
Jh. Schon et al., Solution processed CdS thin film transistors, THIN SOL FI, 385(1-2), 2001, pp. 271-274
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
385
Issue
1-2
Year of publication
2001
Pages
271 - 274
Database
ISI
SICI code
0040-6090(20010402)385:1-2<271:SPCTFT>2.0.ZU;2-0
Abstract
Thin film field-effect transistors based on solution processed CdS have bee n prepared. Mobilities in the range of 5 to 9 cm(2)/Vs and on/off-current r atios exceeding 10(6) are demonstrated. The device performance can be signi ficantly enhanced by annealing in nitrogen resulting in mobilities as high as 45 cm(2)/Vs. The increase in mobility is ascribed to a reduction of trap ping states at the grain boundaries of the CdS thin film, presumably desorp tion of oxygen or water. Solution processing (chemical bath deposition) of inorganic semiconductors might offer a path for low-cost, large-area microe lectronic devices. (C) 2001 Elsevier Science B.V. All rights reserved.