Dynamic mechanical contacts with nanometer-to-micrometer dimensions are imp
ortant in scanned probe microscopy, ultra-low load indentation, microelectr
omechanical al systems, compact discs, etc. The response of these contacts
is poorly understood if they involve adhesive viscoelastic materials, such
as polymers and self-assembled monolayers. We have studied dynamic contacts
to styrene-butadiene latex films. Plots of load vs. displacement show subs
tantial adhesion hysteresis between the loading and unloading portions. The
hysteresis is at least partially due to creep, as indicated by the continu
ed increase in penetration after the start of unloading. Thermodynamic work
s of adhesion were estimated from fits to the loading-unloading data obtain
ed at small loading and unloading rates. Theoretical models that include ad
hesion but neglect long-range creep effects could not fit the data at all l
oading rates. Creep tests were carried out under constant load. A model due
to Hui, Baney, and Kramer (HBK), which predicts the response of an adhesiv
e viscoelastic contact under increasing load, was used to extract a mode I
stress-intensity functional from the data. When this functional is normaliz
ed by the square root of the displacement rate, it is shown empirically, to
have a simple, nearly universal time-dependence. Variations of this univer
sal form due to load, range of interaction potential, glass transition temp
erature, and probe shape art: weak. This result supports the suggestion of
HBK that the stress-intensity functional provides a useful way to character
ize adhesive contacts to viscoelastic materials.