Dual-vessel integrated microwave sample decomposition and digest evaporation for trace element analysis of silicon material by ICPMS: Design and application

Authors
Han, Y Kingston, HM Richter, RC Pirola, C
Citation
Y. Han et al., Dual-vessel integrated microwave sample decomposition and digest evaporation for trace element analysis of silicon material by ICPMS: Design and application, ANALYT CHEM, 73(6), 2001, pp. 1106-1111
Citations number
23
Categorie Soggetti
Chemistry & Analysis","Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICAL CHEMISTRY
ISSN journal
00032700 → ACNP
Volume
73
Issue
6
Year of publication
2001
Pages
1106 - 1111
Database
ISI
SICI code
0003-2700(20010315)73:6<1106:DIMSDA>2.0.ZU;2-I
Abstract
A dual-vessel apparatus using closed-vessel microwave sample preparation is designed. A protocol that includes in situ reagent purification, sample de composition, and digest evaporation has been developed. The essential chemi stry mechanisms will be discussed in detail. Application of the method for analysis of trace amounts of chromium, nickel, copper, and zinc in polycrys talline silicon using inductively coupled plasma mass spectrometry (ICPMS) is demonstrated.