LEAKAGE CURRENT MEASUREMENT IN MULTIELECTRODE LASERS USING OPTICAL LOW-COHERENCE REFLECTOMETRY

Citation
U. Wiedmann et P. Gallion, LEAKAGE CURRENT MEASUREMENT IN MULTIELECTRODE LASERS USING OPTICAL LOW-COHERENCE REFLECTOMETRY, IEEE photonics technology letters, 9(8), 1997, pp. 1134-1136
Citations number
6
Categorie Soggetti
Optics,"Physics, Applied
ISSN journal
10411135
Volume
9
Issue
8
Year of publication
1997
Pages
1134 - 1136
Database
ISI
SICI code
1041-1135(1997)9:8<1134:LCMIML>2.0.ZU;2-O
Abstract
In multielectrode lasers, the interelectrode spacing is often reduced in order to avoid the saturable absorber effect in this region, which could cause instabilities of the laser. This leads to an interelectrod e leakage current between adjacent electrodes, Measuring this leakage current by conventional means is very difficult and often inaccurate, in particular, when the part of the leakage current reinjected into an active region has to be determined, Based on optical low-coherence re flectometry, a method is presented which allows the measurement of thi s leakage current with an error smaller than 10%. Additionally, the ef fective group indexes of the laser waveguide and its bulk material wil l be determined.