Jhl. Pang et al., Thermal cycling aging effects on microstructural and mechanical propertiesof a single PBGA solder joint specimen, IEEE T COMP, 24(1), 2001, pp. 10-15
Citations number
13
Categorie Soggetti
Material Science & Engineering
Journal title
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES
This paper reports on an experimental study on how thermal cycling aging ex
posure changes the solder joint microstructure, intermetallic layer thickne
ss and the residual shear strength and fatigue life in a single plastic hal
l grid array (PBGA) solder joint specimen. In this study, a single EGA sold
er joint specimen was specially designed to evaluate the microstructure and
mechanical properties of three different batches of solder joint after sub
jected to 0, 500, 1000, and 2000 cycles of thermal cycling aging (-40 degre
esC to 125 degreesC). It is important to relate the effects of thermal cycl
ing aging on the changes of the microstructural and intermetallic layer thi
ckness to the residual shear strength and fatigue life of solder joints sub
jected to thermal cycling aging exposure. The results of this study shows t
hat the microstructural and intermetallic development due to thermal cyclin
g aging has a major impact on the residual mechanical and fatigue strength
of the solder joint. It was noted that the solder joint shear strength and
residual fatigue life degrades with exposure to thermal cycling aging.