THERMAL DRIFTS OF MICROELECTRONIC CAPACIT IVE PRESSURE SENSOR

Citation
A. Ettouhami et al., THERMAL DRIFTS OF MICROELECTRONIC CAPACIT IVE PRESSURE SENSOR, Journal de physique. III, 7(7), 1997, pp. 1537-1548
Citations number
9
Categorie Soggetti
Material Science","Phsycs, Fluid & Plasmas","Physics, Applied
Journal title
ISSN journal
11554320
Volume
7
Issue
7
Year of publication
1997
Pages
1537 - 1548
Database
ISI
SICI code
1155-4320(1997)7:7<1537:TDOMCI>2.0.ZU;2-1
Abstract
The thermal drifts of microelectronic capacitive pressure sensor have been analysed by finite-element method. Various boundary conditions re presenting a wide gamut of support of sensor have been considered: sen sor with free base, sensor with fixed base and sensor attached to a su pport of alumina. For every case, the thermal response of sensor have been determined as a function of sensor dimensions in order to push fa r the buckling temperature and hence reduce the thermal sensitivity. F or some sensors very sensitive to pressure, this temperature is small and the thermal drifts are important. A sensor with fixed base having a diaphragm of 1000 mu m of radius and 12 mu m of thickness and having a 3.5 mu m of plate separation presents a thermal sensitivity of -200 Pa degrees C-1 above 80 degrees C. A sensor attached to a support of alumina, having a more wide diaphragm (1800 mu m of radius) presents a thermal sensitivity of 3.1 Pa C-o(-1) below -100 degrees C.