Adhesion of ultrathin ZrO2(111) films on Ni(111) from first principles

Citation
A. Christensen et Ea. Carter, Adhesion of ultrathin ZrO2(111) films on Ni(111) from first principles, J CHEM PHYS, 114(13), 2001, pp. 5816-5831
Citations number
82
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CHEMICAL PHYSICS
ISSN journal
00219606 → ACNP
Volume
114
Issue
13
Year of publication
2001
Pages
5816 - 5831
Database
ISI
SICI code
0021-9606(20010401)114:13<5816:AOUZFO>2.0.ZU;2-H
Abstract
We have studied the ZrO2(111)/Ni(111) interface using the ultrasoft pseudop otential formalism within density functional theory. We find that ZrO2(111) adheres relatively strongly at the monolayer level but thicker ceramic fil ms interact weakly with the Ni-substrate. We argue that the cohesion change s character from dominantly image charge interactions for thick ceramic fil ms to more covalent for monolayer ZrO2(111) films. We provide an analysis o f energetic, structural and electronic aspects of the ZrO2/Ni interface as a function of the thickness of the oxide layer. We also address the role of the exchange-correlation density functional parameterization for modeling the oxide and metal/oxide interface and discuss the sensitivity of the supe rcell approximation for metal/oxide interface properties. (C) 2001 American Institute of Physics.