Effect of InxGa1-xAs (0 <= x <= 0.4) capping layer on self-assembled 1.3 mu m wavelength InAs/GaAs quantum islands

Citation
Xd. Wang et al., Effect of InxGa1-xAs (0 <= x <= 0.4) capping layer on self-assembled 1.3 mu m wavelength InAs/GaAs quantum islands, J CRYST GR, 223(3), 2001, pp. 363-368
Citations number
13
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
223
Issue
3
Year of publication
2001
Pages
363 - 368
Database
ISI
SICI code
0022-0248(200103)223:3<363:EOI(<X>2.0.ZU;2-0
Abstract
We report the effect of InchiGa1-chiAs (0 less than or equal to chi less th an or equal to0.4) capping layer on photoluminescence (PL) properties of 1. 3 mum wavelength self-assembled InAs quantum islands, which are formed via depositing 3.5 monolayers (ML) InAs on GaAs (1 0 0) substrate by molecular beam epitaxy (MBE). Compared with the InchiGa1-chiAs capping layer containi ng a larger In mole fraction chi greater than or equal to0.2 and the GaAs c apping layer (chi = 0), the InAs islands covered by the In0.1Ga0.9As layer show PL with lower emission energy, narrower full-width at half-maximum (FW HM), and quite stronger intensity. The PL peak energy and FWHM become more temperature dependent with the increase of In content in the InchiGa1-chiAs capping layer (chi greater than or equal to0.2), while the InAs islands co vered by the In0.1Ga0.9As layer is much less temperature sensitive. In addi tion, the InAs islands covered by the In0.1Ga0.9As capping layer show room temperature PL wavelength at about 1.3 mum. (C) 2001 Published by Elsevier Science B.V.