Elastic electron reflection for determination of the inelastic mean free path of medium energy electrons in 24 elemental solids for energies between 50 and 3400 eV
Wsm. Werner et al., Elastic electron reflection for determination of the inelastic mean free path of medium energy electrons in 24 elemental solids for energies between 50 and 3400 eV, J ELEC SPEC, 113(2-3), 2001, pp. 127-135
Citations number
38
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Elastic electron backscattering coefficients have been measured for 24 elem
ental solids (Ag, Al, Au, Be, Bi, C, Co, Cu, Fe, Ge, Mg, Mn, Mo, Ni, Ta, Te
, Ti, Pb, Pd, Pt, Si, V, W and Zn) for energies between 50 and 3400 eV. Val
ues for the electron inelastic mean free path (IMFP) were derived from the
experimental intensities on the basis of a simple physical model that accou
nts for bulk elastic and inelastic scattering only. The internal consistenc
y of the data set and the evaluation procedure is satisfactory for energies
> 150 eV. For energies greater than or equal to 200 eV the IMFP values wer
e found to be well described by the Bethe equation for inelastic scattering
, as found earlier by analysis of optical scattering data with the aid of t
he linear response theory [Surf. Interface Anal. 21 (1994) 165]. We also co
mpare the parameters beta (being related to the total dipole matrix element
s for inelastic scattering) and gamma (determining the details of the energ
y dependence of the IMFP) that appear in the Bethe equation with correspond
ing results based on optical data. Both parameters were found to agree well
with the earlier analysis by Tanuma et al. [Surf. Interface Anal. 21 (1994
) 165] within the statistical accuracy of the present analysis. Experimenta
l data on the recoil energy in elastic scattering were also analyzed and co
mpared with detailed results of Monte Carlo simulations of this phenomenon.
The recoil energies are correctly predicted to within 10% by the single de
flection model based on the Rutherford cross section. (C) 2001 Elsevier Sci
ence B.V. All rights reserved.