XPS studies of Auger parameter shift of ZnS1-xTex alloys

X-ray photoelectron spectroscopy (XPS) was used to study the photoelectron emission of a relatively unexplored semi-insulator ZnS1-xTex alloy system. The investigation was focused on the Auger parameter shifts of Zn and Te as a function of composition. Taking into account the alloy disordering and t he semi-insulating characteristics of the ZnS1-xTex alloy system, a model b ased on the concept of relaxation is used to explain the polarization chang e of this alloy system dud to the existence of the two core holes left in t he Auger process. To complement this theoretical model, the dielectric cons tants of ZnS1-xTex alloys as a function of composition were measured using a structure similar to a parallel plate capacitor. The Auger parameter shif ts calculated from this model are in good agreement with that obtained from the XPS measurement. (C) 2001 Elsevier Science B.V. All rights reserved.