Review of models and the disturbed state concept for thermomechanical analysis in electronic packaging

Citation
Cs. Desai et R. Whitenack, Review of models and the disturbed state concept for thermomechanical analysis in electronic packaging, J ELEC PACK, 123(1), 2001, pp. 19-33
Citations number
65
Categorie Soggetti
Mechanical Engineering
Journal title
JOURNAL OF ELECTRONIC PACKAGING
ISSN journal
10437398 → ACNP
Volume
123
Issue
1
Year of publication
2001
Pages
19 - 33
Database
ISI
SICI code
1043-7398(200103)123:1<19:ROMATD>2.0.ZU;2-M
Abstract
A number of models for thermomechanical stress analysis and fatigue failure of materials are reviewed and their capabilities and limitations are ident ified. The unified disturbed state concept (DSC)for constitutive,modeling o f materials and interfaces is presented and compared with other approaches. An approximate procedure based on the DSC is proposed for accelerated desi gn-analysis and cyclic fatigue failure. Solutions of example problems using the DSC and associated computer (FE) procedures are included to illustrate its integrated and improved capabilities for analysis of stresses, strains , microcracking, fracture and fatigue failure, and reliability.