Mechanical reliability of epoxy molding compounds in plastic packages of in
tegrated circuits (IC) is greatly affected by the compound ability to absor
b moisture. Accordingly, the objective of the study is to evaluate the effe
ct of moisture sorption on the mechanical properties of the compound. Exper
imental studies were conducted to evaluate the moisture diffusion in compou
nds with different, from moderate to high, concentration of silica and alum
ina nitride fillers. The weight-gained analysis indicated that the moisture
diffusion was of non-Fickian type and depended mainly on the specimen's re
lative humidity and the filler concentration. We found that although the hy
gro-thermal stresses, caused by moisture diffusion, were relatively low, su
ch diffusion led to an appreciable decrease in the compound's strength. Moi
sture diffusion can result also in a substantial increase in the material's
plasticity. The obtained results can be helpful in the analysis of the mec
hanical behavior of molding molding compounds employed in electronic packag
ing. These results can be used to better understand and to improve the reli
ability of plastic packages of IC devices.