Rutile-phase TiO2 thin films have been epitaxially grown on GaAs(100) subst
rates at 700 degreesC under 5 Pa oxygen ambient pressure. and at room tempe
rature (30 degreesC) and 5x10(-4) Pa base vacuum by KrF pulsed excimer lase
r deposition. The [110]-oriented TiO2 films were composed of two types of d
omains perpendicular to each other in the plane. From atomic force microsco
py analysis, the epitaxial films had a surface with roughness less than 7 n
m in root-mean-square. (C) 2001 American Vacuum Society.