XRD and TEM characterization of cuprate thin films epitaxially grown on SrTiO3 (001) vicinal surfaces

Citation
Jl. Maurice et al., XRD and TEM characterization of cuprate thin films epitaxially grown on SrTiO3 (001) vicinal surfaces, PHYSICA C, 351(1), 2001, pp. 5-8
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
351
Issue
1
Year of publication
2001
Pages
5 - 8
Database
ISI
SICI code
0921-4534(20010301)351:1<5:XATCOC>2.0.ZU;2-F
Abstract
We report X-ray diffraction and transmission electron microscopy of YBa2Cu3 O7 (YBCO) and NdBa2Cu3O7 (NBCO) thin films grown by pulsed laser deposition on SrTiO3 (0 0 1) vicinal surfaces (SrTiO3, STO). Most YBCO films tend to grow parallel to the geometrical surface: YBCO (0 0 1) planes are parallel to the substrate surface rather than to STO (0 0 1) planes. On the contrary , NBCO tends to follow the STO (0 0 1) planes. The tetragonal to orthorhomb ic phase transition upon cooling induces twinning in both materials. The tw ins appear to have better defined interfaces in YBCO than in NBCO. While th e two twin variants [1 1 0] and [1 1 0] are present in YBCO, only one occur s in NBCO films. This selectivity of twin orientation might be useful in de vice applications. (C) 2001 Elsevier Science B.V. All rights reserved.