At present it is commonly accepted that thin film formation of YBa2Cu3O7-de
lta (YBCO) on conducting substrate is one of the keys to further developmen
t of advanced devices in the microelectronic and other applications. We hav
e grown YBCO thin films by resistive evaporation technique on MgO coated wi
th metallic layers (Ni or Ag). A simple inexpensive vacuum system equipped
with resistively heated boats for metal and precursor mixture of yttrium, c
opper and barium fluoride powders was used. X-ray diffraction (XRD) and sca
nning electron microscopy techniques were used for texture, morphology and
surface analyses respectively. Electrical and magnetical properties were de
termined by a standard de four-probe method. The way of heating process is
shown to be critical parameter in the film quality. The physical and electr
ical properties of the YBCO films are discussed in Light of the fact that X
RD measurements done on the metallic buffer layers have revealed a multicry
stalline structure. (C) 2001 Elsevier Science B.V. All rights reserved.