Electronic structure of partially hydrogenated Si(100)-(2 x 1) surfaces prepared by thermal and nonthermal desorption

Citation
K. Bobrov et al., Electronic structure of partially hydrogenated Si(100)-(2 x 1) surfaces prepared by thermal and nonthermal desorption, PHYS REV L, 86(12), 2001, pp. 2633-2636
Citations number
20
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
86
Issue
12
Year of publication
2001
Pages
2633 - 2636
Database
ISI
SICI code
0031-9007(20010319)86:12<2633:ESOPHS>2.0.ZU;2-T
Abstract
The electronic structure of partially hydrogenated Si(100)-(2 X 1) surfaces , prepared by controlled thermal annealing and nonthermal photon stimulated desorption of fully hydrogenated Si(100) surfaces, has been investigated b y using valence band photoemission. Thermal and nonthermal desorption are f ound to produce very specific electronic surface structures. This led us to the discovery of two specific surface states having binding energies of 1. 0 and 0.7 eV associated with the isolated Si dimers and single Si dangling bonds, respectively.