InGaAs nanodomains formed in situ on the surface of (Al,Ga)As

Citation
Il. Krestnikov et al., InGaAs nanodomains formed in situ on the surface of (Al,Ga)As, TECH PHYS L, 27(3), 2001, pp. 233-235
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
TECHNICAL PHYSICS LETTERS
ISSN journal
10637850 → ACNP
Volume
27
Issue
3
Year of publication
2001
Pages
233 - 235
Database
ISI
SICI code
1063-7850(2001)27:3<233:INFISO>2.0.ZU;2-A
Abstract
A new method for obtaining InGaAs nanodomains on the surface of GaAs or (Al ,Ga)As is suggested. At the first stage, an InGaAs layer with a thickness a bove the critical value for dislocation formation is deposited onto the sub strate surface by metalorganic CVD. Then the InGaAs film is coated with a t hin AlAs layer and annealed at an elevated temperature. The "repulsion" of AlAs from plastically relaxed regions near dislocations and the high temper ature stability of AlAs result in that evaporation is restricted to the reg ions containing defects. The self-organization effects favor the formation of an ordered array of coherent nanodomains that can be used for obtaining buried low-dimensional nanostructures and/or nanoheteroepitaxial inclusions . (C) 2001 MAIK "Nauka / Interperiodica".