S. De Nicola et al., Two-beam interferometer for measuring aberrations of optical components with axial symmetry, APPL OPTICS, 40(10), 2001, pp. 1631-1636
We present a concept of interferometric testing, believed to be novel, that
can be applied to measuring aberrations of optical components that have ro
tational symmetry. The optical configuration uses two coherent, collimated
wave fronts that are tilted to impinge upon the optical component being tes
ted such that one beam is on axis and the other is off axis. For small tilt
angles the two aberrated wave fronts can be considered to be carrying the
same aberrations. Furthermore, the off-axis beam is displaced along a direc
tion orthogonal to the optical axis of the component. Interference between
the two aberrated wave fronts produces a fringe pattern that is similar to
a lateral shear interference pattern. Moire fringes are obtained by spatial
beating of the interference pattern with a CCD TV camera array. Under such
conditions it is possible to subtract most of the linear carrier that is i
ntrinsically present in the resultant fringe pattern owing to the large def
ocus aberration and tilt. (C) 2001 Optical Society of America.