Near infra-red radiation squeezing through 20 nm voids in obliquely deposited metal films

Authors
Smith, GB Hossain, AKM Gentle, A
Citation
Gb. Smith et al., Near infra-red radiation squeezing through 20 nm voids in obliquely deposited metal films, APPL PHYS L, 78(15), 2001, pp. 2143-2144
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
15
Year of publication
2001
Pages
2143 - 2144
Database
ISI
SICI code
0003-6951(20010409)78:15<2143:NIRST2>2.0.ZU;2-A
Abstract
Obliquely deposited metal films which are nearly continuous, displaying sev eral unexpected solar optical properties. Transmittance intensity, spectral character, preferred direction of incidence, and polarization sensitivity, infer processes which effective-medium models based solely on "interior" p roperties cannot describe. Amplified transmittance through voids around 20 nm wide involving near surface excitations can explain the data. (C) 2001 A merican Institute of Physics.