Br. Chalamala et Rh. Reuss, Argon inclusion in sputtered films and the effect of the gas on molybdenumfield emitter arrays, APPL PHYS L, 78(15), 2001, pp. 2151-2153
Residual gas analysis of a number of field emission displays showed that ar
gon desorbed from molybdenum metal lines was the dominant gas in sealed vac
uum packages. We present experimental results on the emission characteristi
cs of molybdenum field emitter arrays in argon ambient. In argon, the emiss
ion current dropped rapidly similar to that in oxygenic gas ambients. Exist
ing degradation models do not provide an adequate explanation for this beha
vior. Rather, we suggest a model based on shallow implantation of argon int
o the field emitter tips that increases the effective width of the tunnelin
g barrier. Experimental support for this model comes from the following obs
ervations: emission current degraded only when the device was turned on; af
ter gas exposure, significant current recovery which followed diffusion typ
e behavior was noted; degradation and recovery rates were functions of part
ial pressure; and no detectable effects associated with sputtering were obs
erved. This mechanism is also consistent with ion pumping known to occur in
field emission displays. (C) 2001 American Institute of Physics.