Conservation of flatband conditions for DySi2 monolayers on n-type Si(111)

Citation
S. Vandre et al., Conservation of flatband conditions for DySi2 monolayers on n-type Si(111), APPL PHYS L, 78(14), 2001, pp. 2012-2014
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
14
Year of publication
2001
Pages
2012 - 2014
Database
ISI
SICI code
0003-6951(20010402)78:14<2012:COFCFD>2.0.ZU;2-5
Abstract
We propose a low-resistivity metal/Si/DySi2/Si multilayer Ohmic contact to n-type Si. For a DySi2 monolayer on n-type Si(111), the Fermi level has bee n found to be located only 0.08 eV below the conduction-band minimum of Si, corresponding to flatband conditions. Here, we demonstrate that this Fermi -level position is conserved to a large extent upon Si overgrowth of the mo nolayer, allowing us to exploit the flatband conditions for device applicat ions under ambient conditions. (C) 2001 American Institute of Physics.