Differential interference contrast x-ray microscopy with submicron resolution

Progress in lithography and nanofabrication [E. Di Fabrizio , Nature (Londo n) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens ba sed on two specially developed zone plates. Switching from bright-field ima ging (absorption contrast) to x-ray DIC, we observe, similar to visible-lig ht microscopy, a dramatic increase in image contrast for weak absorbing sam ples. We anticipate that this technique will have a significant impact on x -ray imaging and may play a role comparable to DIC imaging in visible-light microscopy. (C) 2001 American Institute of Physics.