XPS study of interfaces in a two-layer light-emitting diode made from PPV and Nafion with ionically exchanged Ru(bpy)(3)(2+)

Citation
D. Susac et al., XPS study of interfaces in a two-layer light-emitting diode made from PPV and Nafion with ionically exchanged Ru(bpy)(3)(2+), APPL SURF S, 174(1), 2001, pp. 43-50
Citations number
39
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
174
Issue
1
Year of publication
2001
Pages
43 - 50
Database
ISI
SICI code
0169-4332(20010402)174:1<43:XSOIIA>2.0.ZU;2-Q
Abstract
X-ray photoelectron spectroscopy (XPS) was used to investigate the interfac ial chemistries occurring in a prototype two-layer polymer light-emitting d iode that had been fabricated from PPV and Nafion with ion-exchanged Ru(bpy )(3)(2 +) Magnesium and indium tin oxide (ITO) were used as electrodes, and XPS observations were made as the different layers were added sequentially . Specifically, Mg was deposited on a layer of Nafion with incorporated Ru( bpy)(3)(2 +), and this was itself deposited on PPV-coated ITO. The morpholo gy of Nafion, which is dictated by the strongly hydrophilic and hydrophobic groups that compose it, is indicated to rearrange with the incorporation o f Ru(bpy)(3)(2 +) this rearrangement appears reinforced when a thin film is deposited on PPV. The Mg deposition results in substantial changes in XPS spectra, in part due to a direct interaction with the fluorocarbon backbone of Nation. (C) 2001 Elsevier Science B.V. All rights reserved.