A ruthenium oxide thin film electrode with an average specific capacitance
of 650 F/g and good high rate capability was prepared by electrostatic spra
y deposition (ESD). This technique is a one-step process of preparing ruthe
nium oxide thin film electrode compared with a multistep sol-gel process an
d has features of low-temperature synthesis and easy control of surface mor
phology. While as-prepared hydrous ruthenium oxide (RuO2 . xH(2)O) thin fil
m was in an amorphous phase, the hydrous ruthenium oxide (RuO2 . xH(2)O) th
in film became crystalline after annealing at temperatures > 200 degreesC.
Ruthenium oxide thin film electrode annealed at 200 degreesC showed a cycli
c voltammogram indicative of a typical capacitive behavior in 0.5 M H2SO4 e
lectrolyte at a scan rate of 20 mV/s with the average specific capacitance
of 650 F/g. The average specific capacitance was 640 F/g at 2 mV/s and 600
F/g at 50 mV/s, respectively, indicating that the average specific capacita
nce decreases only slightly with increasing scan rate. (C) 2001 The Electro
chemical Society. All rights reserved.