Fizeau's interferometer device in thin superconducting films

Citation
O. Buisson et al., Fizeau's interferometer device in thin superconducting films, EUROPH LETT, 54(1), 2001, pp. 98-104
Citations number
30
Categorie Soggetti
Physics
Journal title
EUROPHYSICS LETTERS
ISSN journal
02955075 → ACNP
Volume
54
Issue
1
Year of publication
2001
Pages
98 - 104
Database
ISI
SICI code
0295-5075(200104)54:1<98:FIDITS>2.0.ZU;2-K
Abstract
We propose here that thin superconducting lms, deposited on a substrate of high dielectric constant, be used in Fizeau's experiment, which probes how light propagates inside a drifting charged condensate. We predict that the phase shift of the propagating light is well described by an effective Lond on length, and is proportional to v(0)/(w/k), where v(0) is the superfluid velocity and w/k the phase velocity of the propagating mode. We claim that YBa2Cu3O6+x thin lms grown on SrTiO3 form a system where this phase shift i s large enough to be measured.