Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans of silicon and diamond obtained with synchrotron radiation

Citation
E. Rossmanith et al., Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans of silicon and diamond obtained with synchrotron radiation, J APPL CRYS, 34, 2001, pp. 157-165
Citations number
8
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
34
Year of publication
2001
Part
2
Pages
157 - 165
Database
ISI
SICI code
0021-8898(20010401)34:<157:KTMIPA>2.0.ZU;2-1
Abstract
In a previous paper by Rossmanith [J. Appl. Cryst. (2000), 33, 1405-1414], expressions for the calculation of multiple-diffraction patterns observed i n omega-psi scans of Bragg reflections were derived within the framework of the kinematical theory, taking into account the divergence and wavelength spread of the incident beam, as well as the mosaic structure of the crystal sample. Agreement with Cu K alpha experiments was demonstrated. In this pa per, it is shown that the theoretical expressions are also suitable for syn chrotron radiation experiments.