Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans of silicon and diamond obtained with synchrotron radiation
E. Rossmanith et al., Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans of silicon and diamond obtained with synchrotron radiation, J APPL CRYS, 34, 2001, pp. 157-165
In a previous paper by Rossmanith [J. Appl. Cryst. (2000), 33, 1405-1414],
expressions for the calculation of multiple-diffraction patterns observed i
n omega-psi scans of Bragg reflections were derived within the framework of
the kinematical theory, taking into account the divergence and wavelength
spread of the incident beam, as well as the mosaic structure of the crystal
sample. Agreement with Cu K alpha experiments was demonstrated. In this pa
per, it is shown that the theoretical expressions are also suitable for syn
chrotron radiation experiments.