CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy

Authors
Bal, K Kirilyuk, A Rasing, T Luo, Y Samwer, K Haast, MAM Lodder, JC
Citation
K. Bal et al., CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy, J APPL PHYS, 89(8), 2001, pp. 4670-4672
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
8
Year of publication
2001
Pages
4670 - 4672
Database
ISI
SICI code
0021-8979(20010415)89:8<4670:CIRPBN>2.0.ZU;2-T
Abstract
The crystallographic contribution of the nonlinear magneto-optical response from CoNi/Pt interfaces appears to scale linearly with increasing interfac e roughness as determined by small angle x-ray scattering and atomic force microscopy. From the magnetic contribution it follows that the increased in terface roughness causes the interface moment to turn out of plane while th e bulk of the film has an in-plane magnetization. (C) 2001 American Institu te of Physics.