Scanning Anger microscopy: recent progress in data analysis and instrumentation

Authors
Jacka, M
Citation
M. Jacka, Scanning Anger microscopy: recent progress in data analysis and instrumentation, J ELEC SPEC, 114, 2001, pp. 277-282
Citations number
18
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
114
Year of publication
2001
Pages
277 - 282
Database
ISI
SICI code
0368-2048(200103)114:<277:SAMRPI>2.0.ZU;2-V
Abstract
Recent developments in scanning Auger microscopy (SAM) are described. Empha sis is given to a method of parallel acquisition of the electron energy spe ctra and the benefits of spectrum-imaging for which it is capable of perfor ming. In view of the maturity of the field of SAM, motivations and prospect s for further developments are discussed. (C) 2001 Elsevier Science B.V. Al l rights reserved.