Comparison of MEED- and XPD-angular patterns from the Cu(001)-surface

Citation
D. Reinicke et al., Comparison of MEED- and XPD-angular patterns from the Cu(001)-surface, J ELEC SPEC, 114, 2001, pp. 461-470
Citations number
21
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
114
Year of publication
2001
Pages
461 - 470
Database
ISI
SICI code
0368-2048(200103)114:<461:COMAXP>2.0.ZU;2-Y
Abstract
The scattering of medium energy electrons (E-kin = 1600 eV) is believed to produce angular intensity distributions similar to those of the X-ray photo electron diffraction experiment. We show here that, in a special experiment al geometry, very important differences between MEED and XPD angular distri butions arise. In these conditions, elastic Bragg-beams can persist up to m edium electron energies. We further demonstrate by scanning the incidence a ngle only that the incoming beam direction cannot be neglected. (C) 2001 El sevier Science B.V. All rights reserved.