X-ray photoelectron diffraction (XPD) study of the atomic structure of theultrathin CdS phase deposited on Ag(111) by electrochemical atomic layer epitaxy (ECALE)

Authors
Cecconi, T Atrei, A Bardi, U Forni, F Innocenti, M Loglio, F Foresti, ML Rovida, G
Citation
T. Cecconi et al., X-ray photoelectron diffraction (XPD) study of the atomic structure of theultrathin CdS phase deposited on Ag(111) by electrochemical atomic layer epitaxy (ECALE), J ELEC SPEC, 114, 2001, pp. 563-568
Citations number
9
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
114
Year of publication
2001
Pages
563 - 568
Database
ISI
SICI code
0368-2048(200103)114:<563:XPD(SO>2.0.ZU;2-K
Abstract
Electrochemical Atomic Layer Epitaxy (ECALE) was used to obtain multi-atomi c layers of CdS on a single crystal Ag(lll) substrate. Electrochemical stri pping measurements indicate that the amount of Cd and S in these films corr esponds to the stoichiometric 1:1 ratio. This result was confirmed by X-ray photoelectron spectroscopy (XPS). Measurements performed by X-ray photoele ctron diffraction (XPD) permitted the determination of the structure and or ientation of the CdS phase. This structure turned out to be the wurtzite la ttice with the (0001) plane parallel to the substrate plane and a Cd type t ermination. (C) 2001 Elsevier Science B.V. All rights reserved.