The electronic structure of ion beam mixed Co/Pt multilayered films was inv
estigated using synchrotron-based soft X-ray fluorescence (SXF) and photoem
ission spectroscopy (PES). Co/Pt multilayered films (eight periods of Co an
d Pt sublayers) were prepared on Si(100) substrates by alternating electron
-beam evaporation followed by ion beam mixing with 80 keVAr ions under high
vacuum. The SXF and PES measurements show that ion beam mixing can change
the spectral features of Co 3d valence bands for PES spectra and the emissi
on energies for Co L-3 SXF spectra. The similar valence-band characteristic
s of IBM CoPt3 with pure Co and the low emission energy with respect to sta
ble CoPt3 alloy are correlated with the isolated Co 3d states with a weaken
ed interatomic interaction due to the reduced coordination. (C) 2001 Elsevi
er Science B.V. All rights reserved.