Mf. Lopez et al., Applications of soft X-ray absorption spectroscopy to the study of passiveand oxide layers on stainless steels: influence of ion implantation, J ELEC SPEC, 114, 2001, pp. 825-829
Citations number
15
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Soft X-ray absorption spectroscopy (XAS) has been used to study the influen
ce of Si ion implantation on the passive layer of AISI 304 stainless steel,
as well as on its high-temperature oxidation behaviour. Ion implantation i
s a usual technique to improve the corrosion and oxidation resistance of st
eels. To study the effects of ion implantation on the room temperature corr
osion behavior of AISI 304 stainless steel, XAS was performed on the passiv
e layer formed spontaneously in contact with air. To analyse the effects of
ion implantation at high temperatures, the oxide layer formed after an iso
thermal oxidation at 900 degreesC for 32 h was also studied. The results sh
ow a positive influence of Si ion implantation on the corrosion behaviour o
f AISI 304 stainless steel. XAS in the soft X-ray excitation mode has prove
d to be a very suitable technique to perform corrosion science studies. (C)
2001 Elsevier Science BN. All rights reserved.