Applications of soft X-ray absorption spectroscopy to the study of passiveand oxide layers on stainless steels: influence of ion implantation

Citation
Mf. Lopez et al., Applications of soft X-ray absorption spectroscopy to the study of passiveand oxide layers on stainless steels: influence of ion implantation, J ELEC SPEC, 114, 2001, pp. 825-829
Citations number
15
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
114
Year of publication
2001
Pages
825 - 829
Database
ISI
SICI code
0368-2048(200103)114:<825:AOSXAS>2.0.ZU;2-G
Abstract
Soft X-ray absorption spectroscopy (XAS) has been used to study the influen ce of Si ion implantation on the passive layer of AISI 304 stainless steel, as well as on its high-temperature oxidation behaviour. Ion implantation i s a usual technique to improve the corrosion and oxidation resistance of st eels. To study the effects of ion implantation on the room temperature corr osion behavior of AISI 304 stainless steel, XAS was performed on the passiv e layer formed spontaneously in contact with air. To analyse the effects of ion implantation at high temperatures, the oxide layer formed after an iso thermal oxidation at 900 degreesC for 32 h was also studied. The results sh ow a positive influence of Si ion implantation on the corrosion behaviour o f AISI 304 stainless steel. XAS in the soft X-ray excitation mode has prove d to be a very suitable technique to perform corrosion science studies. (C) 2001 Elsevier Science BN. All rights reserved.